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Large Language Models to Generate System-Level Test Programs Targeting Non-functional Properties
Authors:
Denis Schwachhofer,
Peter Domanski,
Steffen Becker,
Stefan Wagner,
Matthias Sauer,
Dirk Pflüger,
Ilia Polian
Abstract:
System-Level Test (SLT) has been a part of the test flow for integrated circuits for over a decade and still gains importance. However, no systematic approaches exist for test program generation, especially targeting non-functional properties of the Device under Test (DUT). Currently, test engineers manually compose test suites from off-the-shelf software, approximating the end-user environment of…
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System-Level Test (SLT) has been a part of the test flow for integrated circuits for over a decade and still gains importance. However, no systematic approaches exist for test program generation, especially targeting non-functional properties of the Device under Test (DUT). Currently, test engineers manually compose test suites from off-the-shelf software, approximating the end-user environment of the DUT. This is a challenging and tedious task that does not guarantee sufficient control over non-functional properties. This paper proposes Large Language Models (LLMs) to generate test programs. We take a first glance at how pre-trained LLMs perform in test program generation to optimize non-functional properties of the DUT. Therefore, we write a prompt to generate C code snippets that maximize the instructions per cycle of a super-scalar, out-of-order architecture in simulation. Additionally, we apply prompt and hyperparameter optimization to achieve the best possible results without further training.
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Submitted 19 March, 2024; v1 submitted 15 March, 2024;
originally announced March 2024.
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Power-balanced Memristive Cryptographic Implementation Against Side Channel Attacks
Authors:
Ziang Chen,
Li-Wei Chen,
Xianyue Zhao,
Kefeng Li,
Heidemarie Schmidt,
Ilia Polian,
Nan Du
Abstract:
Memristors, as emerging nano-devices, offer promising performance and exhibit rich electrical dynamic behavior. Having already found success in applications such as neuromorphic and in-memory computing, researchers are now exploring their potential for cryptographic implementations. In this study, we present a novel power-balanced hiding strategy utilizing memristor groups to conceal power consump…
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Memristors, as emerging nano-devices, offer promising performance and exhibit rich electrical dynamic behavior. Having already found success in applications such as neuromorphic and in-memory computing, researchers are now exploring their potential for cryptographic implementations. In this study, we present a novel power-balanced hiding strategy utilizing memristor groups to conceal power consumption in cryptographic logic circuits. Our approach ensures consistent power costs of all 16 logic gates in Complementary-Resistive-Switching-with-Reading (CRS-R) logic family during writing and reading cycles regardless of Logic Input Variable (LIV) values. By constructing hiding groups, we enable an effective power balance in each gate hiding group. Furthermore, experimental validation of our strategy includes the implementation of a cryptographic construction, xor4SBox, using NOR gates. The circuit construction without the hiding strategy and with the hiding strategy undergo T-test analysis, confirming the significant improvement achieved with our approach. Our work presents a substantial advancement in power-balanced hiding methods, offering enhanced security and efficiency in logic circuits.
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Submitted 2 December, 2023;
originally announced December 2023.
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Optimal Qubit Reuse for Near-Term Quantum Computers
Authors:
Sebastian Brandhofer,
Ilia Polian,
Kevin Krsulich
Abstract:
Near-term quantum computations are limited by high error rates, the scarcity of qubits and low qubit connectivity. Increasing support for mid-circuit measurements and qubit reset in near-term quantum computers enables qubit reuse that may yield quantum computations with fewer qubits and lower errors. In this work, we introduce a formal model for qubit reuse optimization that delivers provably opti…
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Near-term quantum computations are limited by high error rates, the scarcity of qubits and low qubit connectivity. Increasing support for mid-circuit measurements and qubit reset in near-term quantum computers enables qubit reuse that may yield quantum computations with fewer qubits and lower errors. In this work, we introduce a formal model for qubit reuse optimization that delivers provably optimal solutions with respect to quantum circuit depth, number of qubits, or number of swap gates for the first time. This is in contrast to related work where qubit reuse is used heuristically or optimally but without consideration of the mapping effort. We further investigate reset errors on near-term quantum computers by performing reset error characterization experiments. Using the hereby obtained reset error characterization and calibration data of a near-term quantum computer, we then determine a qubit assignment that is optimal with respect to a given cost function. We define this cost function to include gate errors and decoherence as well as the individual reset error of each qubit. We found the reset fidelity to be state-dependent and to range, depending on the reset qubit, from 67.5% to 100% in a near-term quantum computer. We demonstrate the applicability of the developed method to a number of quantum circuits and show improvements in the number of qubits and swap gate insertions, estimated success probability, and Hellinger fidelity of the investigated quantum circuits.
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Submitted 31 July, 2023;
originally announced August 2023.
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Physics inspired compact modelling of BiFeO$_3$ based memristors for hardware security applications
Authors:
Sahitya Yarragolla,
Nan Du,
Torben Hemke,
Xianyue Zhao,
Ziang Chen,
Ilia Polian,
Thomas Mussenbrock
Abstract:
With the advent of the Internet of Things, nanoelectronic devices or memristors have been the subject of significant interest for use as new hardware security primitives. Among the several available memristors, BiFe$\rm O_{3}$ (BFO)-based electroforming-free memristors have attracted considerable attention due to their excellent properties, such as long retention time, self-rectification, intrinsi…
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With the advent of the Internet of Things, nanoelectronic devices or memristors have been the subject of significant interest for use as new hardware security primitives. Among the several available memristors, BiFe$\rm O_{3}$ (BFO)-based electroforming-free memristors have attracted considerable attention due to their excellent properties, such as long retention time, self-rectification, intrinsic stochasticity, and fast switching. They have been actively investigated for use in physical unclonable function (PUF) key storage modules, artificial synapses in neural networks, nonvolatile resistive switches, and reconfigurable logic applications. In this work, we present a physics-inspired 1D compact model of a BFO memristor to understand its implementation for such applications (mainly PUFs) and perform circuit simulations. The resistive switching based on electric field-driven vacancy migration and intrinsic stochastic behaviour of the BFO memristor are modelled using the cloud-in-a-cell scheme. The experimental current-voltage characteristics of the BFO memristor are successfully reproduced. The response of the BFO memristor to changes in electrical properties, environmental properties (such as temperature) and stress are analyzed and consistent with experimental results.
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Submitted 7 October, 2022;
originally announced October 2022.
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Optimal Mapping for Near-Term Quantum Architectures based on Rydberg Atoms
Authors:
Sebastian Brandhofer,
Hans Peter Büchler,
Ilia Polian
Abstract:
Quantum algorithms promise quadratic or exponential speedups for applications in cryptography, chemistry and material sciences. The topologies of today's quantum computers offer limited connectivity, leading to significant overheads for implementing such quantum algorithms. One-dimensional topology displacements that remedy these limits have been recently demonstrated for architectures based on Ry…
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Quantum algorithms promise quadratic or exponential speedups for applications in cryptography, chemistry and material sciences. The topologies of today's quantum computers offer limited connectivity, leading to significant overheads for implementing such quantum algorithms. One-dimensional topology displacements that remedy these limits have been recently demonstrated for architectures based on Rydberg atoms, and they are possible in principle in photonic and ion trap architectures. We present the first optimal quantum circuit-to-architecture mapping algorithm that exploits such one-dimensional topology displacements. We benchmark our method on quantum circuits with up to 15 qubits and investigate the improvements compared with conventional mapping based on inserting swap gates into the quantum circuits. Depending on underlying technology parameters, our approach can decrease the quantum circuit depth by up to 58% and increase the fidelity by up to 29%. We also study runtime and fidelity requirements on one-dimensional displacements and swap gates to derive conditions under which one-dimensional topology displacements provide benefits.
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Submitted 9 September, 2021;
originally announced September 2021.
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Exploring the Mysteries of System-Level Test
Authors:
Ilia Polian,
Jens Anders,
Steffen Becker,
Paolo Bernardi,
Krishnendu Chakrabarty,
Nourhan ElHamawy,
Matthias Sauer,
Adit Singh,
Matteo Sonza Reorda,
Stefan Wagner
Abstract:
System-level test, or SLT, is an increasingly important process step in today's integrated circuit testing flows. Broadly speaking, SLT aims at executing functional workloads in operational modes. In this paper, we consolidate available knowledge about what SLT is precisely and why it is used despite its considerable costs and complexities. We discuss the types or failures covered by SLT, and outl…
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System-level test, or SLT, is an increasingly important process step in today's integrated circuit testing flows. Broadly speaking, SLT aims at executing functional workloads in operational modes. In this paper, we consolidate available knowledge about what SLT is precisely and why it is used despite its considerable costs and complexities. We discuss the types or failures covered by SLT, and outline approaches to quality assessment, test generation and root-cause diagnosis in the context of SLT. Observing that the theoretical understanding for all these questions has not yet reached the level of maturity of the more conventional structural and functional test methods, we outline new and promising directions for methodical developments leveraging on recent findings from software engineering.
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Submitted 11 March, 2021;
originally announced March 2021.
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Towards Secure Composition of Integrated Circuits and Electronic Systems: On the Role of EDA
Authors:
Johann Knechtel,
Elif Bilge Kavun,
Francesco Regazzoni,
Annelie Heuser,
Anupam Chattopadhyay,
Debdeep Mukhopadhyay,
Soumyajit Dey,
Yunsi Fei,
Yaacov Belenky,
Itamar Levi,
Tim Güneysu,
Patrick Schaumont,
Ilia Polian
Abstract:
Modern electronic systems become evermore complex, yet remain modular, with integrated circuits (ICs) acting as versatile hardware components at their heart. Electronic design automation (EDA) for ICs has focused traditionally on power, performance, and area. However, given the rise of hardware-centric security threats, we believe that EDA must also adopt related notions like secure by design and…
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Modern electronic systems become evermore complex, yet remain modular, with integrated circuits (ICs) acting as versatile hardware components at their heart. Electronic design automation (EDA) for ICs has focused traditionally on power, performance, and area. However, given the rise of hardware-centric security threats, we believe that EDA must also adopt related notions like secure by design and secure composition of hardware. Despite various promising studies, we argue that some aspects still require more efforts, for example: effective means for compilation of assumptions and constraints for security schemes, all the way from the system level down to the "bare metal"; modeling, evaluation, and consideration of security-relevant metrics; or automated and holistic synthesis of various countermeasures, without inducing negative cross-effects. In this paper, we first introduce hardware security for the EDA community. Next we review prior (academic) art for EDA-driven security evaluation and implementation of countermeasures. We then discuss strategies and challenges for advancing research and development toward secure composition of circuits and systems.
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Submitted 27 January, 2020;
originally announced January 2020.
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Electromechanical Reliability Testing of Three-Axial Silicon Force Sensors
Authors:
S. Spinner,
J. Bartholomeyczik,
B. Becker,
M. Doelle,
O. Paul,
I. Polian,
R. Roth,
K. Seitz,
P. Ruther
Abstract:
This paper reports on the systematic electromechanical characterization of a new three-axial force sensor used in dimensional metrology of micro components. The siliconbased sensor system consists of piezoresistive mechanicalstress transducers integrated in thin membrane hinges supporting a suspended flexible cross structure. The mechanical behavior of the fragile micromechanical structure isana…
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This paper reports on the systematic electromechanical characterization of a new three-axial force sensor used in dimensional metrology of micro components. The siliconbased sensor system consists of piezoresistive mechanicalstress transducers integrated in thin membrane hinges supporting a suspended flexible cross structure. The mechanical behavior of the fragile micromechanical structure isanalyzed for both static and dynamic load cases. This work demonstrates that the silicon microstructure withstands static forces of 1.16N applied orthogonally to the front-side of the structure. A statistical Weibull analysis of the measured data shows that these values are significantly reduced if the normal force is applied to the back of the sensor. Improvements of the sensor system design for future development cycles are derived from the measurement results.
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Submitted 21 November, 2007;
originally announced November 2007.
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Evolutionary Optimization in Code-Based Test Compression
Authors:
Ilia Polian,
Alejandro Czutro,
Bernd Becker
Abstract:
We provide a general formulation for the code-based test compression problem with fixed-length input blocks and propose a solution approach based on Evolutionary Algorithms. In contrast to existing code-based methods, we allow unspecified values in matching vectors, which allows encoding of arbitrary test sets using a relatively small number of code-words. Experimental results for both stuck-at…
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We provide a general formulation for the code-based test compression problem with fixed-length input blocks and propose a solution approach based on Evolutionary Algorithms. In contrast to existing code-based methods, we allow unspecified values in matching vectors, which allows encoding of arbitrary test sets using a relatively small number of code-words. Experimental results for both stuck-at and path delay fault test sets for ISCAS circuits demonstrate an improvement compared to existing techniques.
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Submitted 25 October, 2007;
originally announced October 2007.
